Jean-Noel Perbet, Chair,
THALES AVIONICS, Le Haillan, France
Michael Becker, Display-Metrology & Systems, Karlsruhe, Germany
Victor Belyaev, Samsung Electronics, Lobnya, Moscow Region, Russia
Yvan Bonnassieux, LPICM Ecole Polytechnique, Palaiseau, Cedex, France
Patrick Candry, BARCO NV, Kuurne, Belgium
Vladimir Chigrinov, Hong Kong University of Science & Technology,
Clear Water Bay, Kowloon, Hong Kong
Norbert Fruehauf, University Of Stuttgart, Stuttgart, Germany
Eliav Haskal, Philips Research Laboratories, Eindhoven, The Netherlands
Jyrki Kimmel, Nokia Research Center, Tampere, Finland
Peter Knoll, IF+F Ingenieurbuero, Ettlingen, Germany
Igor Kompanets, Lebedev Physical Institute of RAS, Moscow, Russia
Anthony Lowe, Lambent Consultancy, Braishfield, UK
Jose Magarino, THALES Avionics LCD, Moirans, France
Reiner Mauch, Schott AG, Seoul, Korea
Vassili Nazarenko, Ukrainian Academy of Sciences, Kiev, Ukraine
Gerrit Oversluizen, Philips Research Laboratories, Eindhoven, The
Netherlands
Roger Pieri, RP-Consulting, DIJON, France
Jutta Rasp, FPExperts, München-Feldkirchen, Germany
Frank Rochow, LMT Lichtmesstechnik GmbH, Berlin, Germany
Ian Sage, QinetiQ, Malvern, Worcs, UK
Martin Schadt, MS Hightech Consulting, Seltisberg, Switzerland
Alexander Smirnov, Belarusian State University of Informatics &
Radioelectronics, Minsk, Belarus
Aron Vecht, Aron Vecht And Associates, London, UK
