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Technology Tracks Key |
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| OLEDs | Projection | Active Matrix | Emissive |
| Electronics | Measurement | Applied Vision | Systems |
| Manufacturing | FEDs | Applications | Liquid Crystal |
ADVANCE
PROGRAM
2006 SID INTERNATIONAL SYMPOSIUM
JUNE 6-9,
2006 (Tuesday - Friday)
MOSCONE CONVENTION CENTER
SAN FRANCISCO, CALIFORNIA, USA
Display Measurement
| Session 3: Motion-Artifact Characterization (Display Measurement) | |
| Tuesday, June 6 / 10:50 am - 12:10 pm / Room 132/133 | |
| Chair: Steve Atwood, Display Consultant | |
| Co-Chair: Lou Silverstein, VCD Sciences, Inc. | |
| 3.1: | Advanced
Motion-Artifact Analysis Method for Dynamic-Contrast Degradation
Caused by Line Spreading Joe Miseli, Sun Micorsystems, Inc., Menlo Park, CA, USA |
| 3.2: | LCD
Motion-Artifact Determination Using Simulation Methods Xiao-Hua Li, South East University, Electronic Research Institute, Jiangsu, China |
| 3.3: | Edge-Blur-Width
Analysis Using a Contrast Sensitivity Function Kouichi Oka, Otsuka Elctronics Co., Ltd., Shiga, Japan |
| 3.4: | Improvement
of Motion Image Quality by High Frame Rate Yoshihiko Kuroki, Sony Corp., Kanagawa Japan |
| Session 9: Display Measurement and Standards (Display Measurement) | |
| Tuesday, June 6 / 2:00 - 3:20 pm / Room 132/133 | |
| Chair: Tom Fiske, Rockwell Collins Display Systems | |
| Co-Chair: Frank Rochow, LMT Lichtmesstechnik GmbH | |
| 9.1: | Invited
Paper: International Standards for Electronic-Display
Devices: Current Status and Agenda Michael Becker, Display-Metrology & Systems, Karlsruhe, Germany |
| 9.2: | Temporal
and Color Measurements in Medical Displays Aldo Badano, CDRH/FDA, Rockville, MD, USA |
| 9.3: | High
Throughput Viewing-Angle Measurements Using an Imaging Sphere Doug Kreysar, Radiant Imaging, Duvall, WA, USA |
| 9.4: | Comparing
Reflection Characteristics of Paper Materials and Display Devices John Brewer, Eastman Kodak Co., Rochester, NY, USA |
| Poster Session | |
|
Tuesday, June 6 / 4:00 - 7:00 pm / Esplanade
Ballroom
|
|
| Display Measurement | |
| P.72: | A Chromatic Focal Shift Measurement System for
Three-Panel LCoS Color Management Wen-Chih Tai, Chunghwa Picture Tubes Ltd., Taoyuan, Taiwan |
| P.73: | Determining OLED Power Consumption for Defined Applications Michael Miller, Eastman Kodak Co., Rochester, NY, USA |
| P.74: | Calibration of a Fourier-Optics-Based Measurement System Pierre Boher, Eldim, Herouville St Clair, France |
| P.75: | Useful Inspection Method of Rubbed Polyimide Film with
Optical Anisotropy Using Reflection Ellipsometry Hiroyuki Murai, Advanced Display Systems, Inc., Kyoto, Japan |
| P.76: |
Perceptual Tests of the Temporal Properties of a Shuttered
LCD Projector |